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TN-FTM106-Y
TN
Introducing our Small Film Thickness Monitor, a highly advanced and professional tool designed to meet all your film measurement needs.
This state-of-the-art device is specifically engineered to accurately measure film thickness in various equipment controlled by computers, including resistance thermal evaporation, electron beam evaporation, and magnetron sputtering.
With its cutting-edge technology and precision, our Small Film Thickness Monitor ensures reliable and consistent results, allowing you to monitor and control the thickness of your films with utmost accuracy.
Equipped with advanced features, this monitor is suitable for professionals in industries such as semiconductor manufacturing, optics, and thin film research. Its user-friendly interface and intuitive controls make it easy to operate, even for those with limited experience.
The compact design of our Small Film Thickness Monitor allows for easy integration into existing setups, without requiring excessive space or complicated installation. Its robust construction ensures long-lasting durability, providing you with a reliable tool that will withstand the demands of your work environment.
Invest in our Small Film Thickness Monitor today and experience the convenience and precision it brings to your film measurement processes. Stay ahead of the curve with this professional-grade device that guarantees accurate and efficient film thickness monitoring.
3、 Main parameters:
Crystal frequency | 6MHz |
Operation and display mode | Operate and display by computer |
Thickness display range | 0-99μ9999Å |
Thickness display resolution | 1Å |
Rate display range | 0-9999.9Å |
Rate display resolution | 0.1Å/s |
Number of coating layers | 99 |
Probe input | 2 way (choose one to work) |
Tool factor | 0.01-99.99 |
Material storage | 257kinds |
Communication and power supply | USB interface |
Baffle control | Computer programming |
Size | 100×65×45mm |
Introducing our Small Film Thickness Monitor, a highly advanced and professional tool designed to meet all your film measurement needs.
This state-of-the-art device is specifically engineered to accurately measure film thickness in various equipment controlled by computers, including resistance thermal evaporation, electron beam evaporation, and magnetron sputtering.
With its cutting-edge technology and precision, our Small Film Thickness Monitor ensures reliable and consistent results, allowing you to monitor and control the thickness of your films with utmost accuracy.
Equipped with advanced features, this monitor is suitable for professionals in industries such as semiconductor manufacturing, optics, and thin film research. Its user-friendly interface and intuitive controls make it easy to operate, even for those with limited experience.
The compact design of our Small Film Thickness Monitor allows for easy integration into existing setups, without requiring excessive space or complicated installation. Its robust construction ensures long-lasting durability, providing you with a reliable tool that will withstand the demands of your work environment.
Invest in our Small Film Thickness Monitor today and experience the convenience and precision it brings to your film measurement processes. Stay ahead of the curve with this professional-grade device that guarantees accurate and efficient film thickness monitoring.
3、 Main parameters:
Crystal frequency | 6MHz |
Operation and display mode | Operate and display by computer |
Thickness display range | 0-99μ9999Å |
Thickness display resolution | 1Å |
Rate display range | 0-9999.9Å |
Rate display resolution | 0.1Å/s |
Number of coating layers | 99 |
Probe input | 2 way (choose one to work) |
Tool factor | 0.01-99.99 |
Material storage | 257kinds |
Communication and power supply | USB interface |
Baffle control | Computer programming |
Size | 100×65×45mm |
